Define catalog profile

In this step, you define the

catalog profiles for the quality notifications.

The initial view for the catalog profile pertains to the Q-notifications in general. In this view, you specify:

You can use the classes to define additional problem criteria generally and flexibly, if the problem criteria in the data structure (defect type, defect location, defect cause) cannot be described adequately using the catalogs and texts.
For example, if you maintain the class 'problems in production' along with the class characteristic 'cause,' then you can record the causes of production problems as characteristic values.

Another view applies specifically to the defects recording function. In this view, you specify the unit of measurement and number of decimal places to be used when you record the quantitative defect valuations.
In the defects recording function, you can
valuate the defects quantitatively and, if necessary, assign a unit of measurement to the value. For example, you can use the 'potential for damage' or the 'time and effort required to correct a defect' as a criterion for weighting the defects.




1. Define the required code groups in the catalogs for the quality notifications and maintain the code groups. If necessary, you can maintain the codes at a later time.
2. Determine whether you want to classify the notification items. If necessary, create the classes in the classification system and assign them to the catalog profile. The class characteristics should be defined and maintained at the same time.
Class type 15 is provided for classifying notification items.
If required you can record
class characteristic values in a dialog box when you process classified notification items.
3. If you want to use the defects recording function, determine:
a) whether you will want to valuate the defects quantitatively
b) whether a unit of measurement should be predefined in the catalog profile for this purpose. The unit of measurement must have been defined previously. Refer to the step Units of measurement in the chapter Basic Settings and Environment.

Further notes